基于藍(lán)寶石襯底的全區(qū)域覆蓋的少層二硒化鉑

This product contains full area coverage PtSe2 layers (single/multi) on c-cut sapphire substrates. Sample size measures 1cm in size and the entire sample surface contains PtSe2 sheets. Synthesized full area coverage PtSe2 is highly crystalline, some regions also display significant crystalline anisotropy.

Sample Properties.

Specifications

1)    Identification. Full coverage 100% monolayer PtSe2 uniformly covered across c-cut sapphire

2)    Physical dimensions. One centimeter in size. Larger sizes up to 2-inch wafer-scale available upon requests.

3)    Smoothness. Atomically smooth surface with roughness < 0.15 nm.

4)    Uniformity. Highly uniform surface morphology. PtSe2 monolayers uniformly cover across the sample.

5)    Purity. 99.9995% purity as determined by nano-SIMS measurements

6)    Reliability. Repeatable Raman and photoluminescence response

7)    Crystallinity. High crystalline quality, Raman response, and photoluminescence emission comparable to single crystalline monolayer flakes.

8)    Substrate. c-cut Sapphire but our research and development team can transfer PtSe2 monolayers onto variety of substrates including PET, quartz, and SiO2/Si without significant compromisation of material quality.

9)    Defect profile. PtSe2 monolayers do not contain intentional dopants or defects. However, our technical staff can produce defected PtSe2 using α-bombardment technique.

Supporting datasets [for 100% Full area PtSe2 monolayers on c-cut Sapphire]

Transmission electron images (TEM) acquired from CVD grown full area coverage PtSe2 monolayers on c-cut sapphire confirming high crystallinity

Raman spectroscopy measurement confirm monolayer nature of the CVD grown samples and shows the high crystallinity of the CVD samples. PL spectrum does not show any PL signal due to indirect band nature.